간편결제 가능| 분야 | |
| 적용범위 | Revision Standard - Active - Draft. The testability structure for digital c 1 ircuits described in IEEE Std 1149.1 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard BSDL are defined that allow description of key component-specific aspects of such testability features. |
| 국제분류(ICS)코드 | 31.180 : 회로기판 |
| 페이지수 | 116 |
| Edition |
1. 본 규격서는 해외제본 후 수입품이어서 교환 및 환불이 안됩니다.
2. 해외 배송 제품으로 주문일로부터 7-14일내 배송 가능합니다.
| 분야 | |
| 적용범위 | Revision Standard - Active - Draft. The testability structure for digital c 1 ircuits described in IEEE Std 1149.1 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard BSDL are defined that allow description of key component-specific aspects of such testability features. |
| 국제분류(ICS)코드 | 31.180 : 회로기판 |
| 페이지수 | 116 |
| Edition |
1. 본 규격서는 해외제본 후 수입품이어서 교환 및 환불이 안됩니다.
2. 해외 배송 제품으로 주문일로부터 7-14일내 배송 가능합니다.